Encyclopedia of Statistics in Quality and Reliability
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品牌: Fabrizio RuggeriRon S. KenettFrederick W. Faltin
基本信息出版社:Wiley; 1 (2008年2月19日)精装:1800页正文语种:英语ISBN:0470018615条形码:9780470018613商品尺寸:18.9 x 21.8 x 24.6 cm商品重量:7 KgASIN:0470018615商品描述内容简介An essential reference for statisticians, engineers, and quality professionals in industry, academia, and government, Encyclopedia of Statistics in Quality and Reliability offers an essential knowledge source in an area where one is sorely needed. Providing a practical orientation with a large selection of case studies, this multi-volume state-of-the-art publication examines the widespread use of Six Sigma. This popular quality measuring technique is a highly adaptable tool with many wide-reaching applications in a large variety of sectors.作者简介Editors-in-ChiefFabrizio Ruggeri, CNR-IMATI, Milan, ItalyProf. Ruggeri's research interests include reliability, general statistical modelling with applications in industry, and Bayesian statistics. He is a former President of the European Network for Business and Industrial Statistics (ENBIS) and former Board member of the International Society for Bayesian Analysis (ISBA). He edited two volumes on Bayesian Robustness and special issues of journals. He also served as the Editor (1999-2002) of the ISBA Bulletin and is currently Editor-in-Chief of Applied Stochastic Models in Business and Industry and an Editor of Bayesian Analysis. He is Co-Director of the Applied Bayesian Statistics summer school (ABS) and Chair of the Scientific Committee of the Bayesian Inference in Stochastic Processes (BISP) series of workshops. He is a faculty in the Ph.D. programme in Mathematics and Statisics at the University of Pavia and the Master programme in Applied Mathematics for Industry at University of Milano Bicocca. He has been member of many committees, including Savage Award, De Groot Award and Box Medal. He is the author of nearly 100 publications.Ron S. Kenett, KPA Ltd, Raanana, Israel and University of Turin, Turin, Italy. Professor Kenett’s interests include Strategic Planning and Quality Management, Industrial Statistics and Biostatistics, Statistical Process Control and Design of Experiments, Survey Methodology and Software Quality. He is a Fellow of the Royal Statistical Society, a Senior Member of the American Society for Quality,past member of the board of the Israeli Statistical Association andpast president of ENBIS, the European Network for Business and Industrial Statistics. He iseditor in chief of the journal Quality Technology and Quantitative Management and associate editor of the Journal of the Royal Statistical Society (A) and Applied Stochastic Models in Business and Industry. He isco author of4 books and over 130 papers, including Modern Industrial Statistics (with S. Zacks), Duxbury Press1998, and Software Process Quality - Management and Control (with E. Baker) Marcel Dekker Inc., 1999. Ron has been a consultant for leading corporations such as AT&T, hp, EDS, SanDisk, IBM and Amdocs. His career has combined academic positions with activity in the industrial and business sector.Frederick W. Faltin, The Faltin Group, Cody, WY, USAMr. Faltin’s interests include Managing Six Sigma, Design for Six Sigma, Business Process Simulation & Optimization, Financial Quality, Supply Chain Management, and Design of Experiments. He is a Fellow of the American Statistical Association, a recipient of the Shewell Prize of the American Society for Quality, and has served on the selection committees of various ASQ awards. He served on the Editorial Review Board of the Journal of Quality Technology, is a past Chair of ASA's Quality and Productivity Section, and is a member of the boards of the Quality & Productivity Research Conference and the Fall Technical Conference. Mr. Faltin has published dozens of papers on applications of mathematics & statistics, and has authored Six Sigma curricula for a number of prominent companies, including Motorola—the company that invented Six Sigma. He was formerly manager of the Strategic Enterprise Technologies laboratory at GE’s Global Research Center, and is today Managing Director of The Faltin Group, which he founded in 1999.EditorsBasics StatisticsJeroen de Mast, University of Amsterdam,The NetherlandsComputationally Intensive Methods & SimulationSimon Wilson, Trinity College Dublin, IrelandDesign of Experiments & Robust DesignDavid Steinberg, Tel Aviv University, IsraelHealth, Safety & Environmental ApplicationsTony Greenfield, Greenfield Research, UKManagement of Quality & Business StatisticsBlanton Godfrey, College of Textiles, USARamon Leon, University of Tennessee, USAProcess Capability & Measurement Systems AnalysisConnie Borror, University of Illinois, USAProcess ControlMike Adams, University of Alabama, USAReliability: Life Cycle & Warranty Cost PredictionRefik Soyer, George Washington University, USAReliability: Life Distribution Modeling & Accelerated TestingTom Mazzuchi, George Washington University, USASamplingRainer Göb, University of Wuerzberg, GermanyStatistical and Stochastic ModellingShelley Zacks, Binghamton University, USASystem ReliabilitySteven Rigdon, Southern Illinois University, USA
